QuickTest Pro Software. Graphical Test Automation Software for Windows 8 through XP. Easily develop & store test sequences, automatically run tests, view, print, save and export results. Supports all V7X series units and 964i HV Scanner.
Vitrek V7X Series – No Other Hipot Tester can Touch ’em
For nearly 25 years, an obsessions has driven us to keep improving how hipot testers perform – speed, accuracy, user safety and reliability have been our driving force. Building a better hipot tester is in our DNA – it drove us to successfully engineer the first 4-in-1 safety tester back in 1990 and it has driven us to redefine performance in low cost hipot testers today.
The Hipot Experience has been Redefined
Our goal for the V7X series has been to achieve the unheard of. To provide state-of-the-art performance in a powerful yet compact multi-function hipot tester – and do it at an entry level price. From our easy-to-use Touch user interface, to its ultra-reliability, high efficiency, fan free design – the V7X provides unrivaled performance. Have we met our goal? You be the judge – compare the V7X to our made in China competitors and see how well American engineering stands up. We build Vitrek Hipot Testers. What’s on your production line?
V75 with Built-in Hipot Switching
For high voltage cable & component testing – choose the V75 with 16 channels of built-in high voltage switching. With the versatile V75, you can test hipot or IR for any combination of up to 8 test points and you can measure low resistance (from .001 ohm to 60K ohms) on up to 8 conductors. All automatically with a single touch and all from a single compact tester. For requirements exceeding 8 points, the V7X can control up to 4 Vitrek 964i 64 channel HV Switching Systems – providing up to 256 channels of Hipot test capability. Simple, fast, automatic multi-point hipot – make the switch to the Vitrek V7X. You will be glad you did.
Product Features and Benefits
- 4.3″ Color Touch Display – Easy To Use Intuitive User Interface
- 6 Functions Choose From – AC/DC Hipot, IR, Ground Bond, Continuity & Built-in Switching
- Made in the USA – Designed & Built in San Diego CA
- Compact, Lightweight, Rugged, Fan Free, Fast (100mS min test time) & Accurate
- 5KV AC/DC Hipot, 20mA max source current
- Ground Bond 1-30A RMS (42 A peak), 100µΩ Resolution
- 100 nano-Amp Leakage Current Resolution
- Low Cost of Ownership – 2 Year Calibration Interval
- USB 2.0, Serial/RS232, Digital I/O Interfaces are Standard
- Continuously Variable Insulation Resistance 20-5000V, 450GΩ Max
- Multi Mode IR with Steady/Rising Pass Mode
- Test Memory Stores up to 999 Steps and 60 Test Sequences
- Internal Self Test Fully Exercises Output and Verifies Current Accuracy
- Pre-Programmed Daily Verification Test With Optional PVD Test Load
- Ramped Discharge Capability
- Selectable ARC Detection 1-20mA
- Meets UL, CSA, IEC Safety Tester Requirements
- CE Safety Mark Certified to EN61010
- 2 Year Parts & Labor Warranty
Front Panel Features
- 4.3″ Color Touch Display, All of the info you need – Super Easy to Use
- Large, Bright LED Caution Testing Indicator
- Safety Locked HV Terminal for Hipot & IR
- Low Profile High Current Binding Posts for Ground Bond
- Independent LED Pass/Fail Indicators
- The Brand You Trust on Your Production Line
- Convenient Front Panel Power Switch
- Ultra-High Reliability Start/Stop Switches
Rear Panel Features
- Digital I/O with Safety Interlock
- Controls up to 4 HV Scanners (N/A on V75 with built-in HV Switching)
- USB 2.0 High Speed Universal Serial Port
- RS232 Serial Port with Selectable baud rate up to 115Kbaud
- Ultra-Quiet, Ultra-Reliable, High Efficiency Fan Free Design
- Heavy Duty 100% Silicone Protective Bumpers
- Advanced Design, Built-in Quality – Made in the USA
- Optional Rear Panel Terminals or on V75 16 terminals for Hipot/IR & Continuity
- Rugged V7X with Drop Resistant Duty Silicone Bumper
V7X Test Step Specifications
Accuracy specifications shown are valid at temperatures within ±5C of the calibration temperature. Outside of this range add 10% of the specification per C. Decrease maximum ACW, DCW and IR voltages by 2.5%/1000ft above 5000ft ASL altitude. All accuracy specifications are valid at the V7X terminals, and as such do not include any effects due to user wiring resistances, leakages or coupling, or other user generated leakages or interference. Resolutions shown are for displayed measurements, limits and settings. Internally all measurements have typically 10x better resolution and all limits and settings are implemented with the same resolution as entered by the user. Via an interface, all measurements are reported with 5 digit resolution. Generally, user settings can be defined with up to 4 digit resolution and a selection of units (e.g. µA or mA) from the front panel; or with up to 6 digit resolution from an interface. Unless otherwise specified, user terminated dwell/test periods can extend for up to 2 days.
Not all test types are available in all models of V7X.
ACW Test Steps
Voltage 10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05% Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05% Model V76: 10 to 2500Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05% 1%+5V accuracy under all allowed loading conditions Max. Load 20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000V Leakage Accuracy DC coupled, true RMS, 10Hz-4KHz 3dB bandwidth DUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution) DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution) ARC Limit Disabled or up to 30mA (1mA resolution) Ramp 0 to 99.9sec (0.02sec resolution) Dwell 0.1 to 9999sec (0.1sec resolution) or user terminated Shutdown Excessive HV terminal current : within 1ms User Stop : within 2ms Interlock opened (if enabled) : within 2ms Load Breakdown (sudden uncontrolled increase of load current): within 150µs Leakage Limit (if enabled) : within 100ms ARC Limit (if enabled) : within 1ms User Settings Voltage Level Frequency DUT Isolated/Grounded Min. Leakage Limit (can be disabled) Max. Leakage Limit (can be disabled) ARC Limit (can be disabled) Ramp Period Dwell Period Ramp Down Fast/As Ramp Stop/Continue Sequence on Failure
DCW Test Steps
Voltage 20 to 5000VDC (1V resolution) Model V75: 20 to 3000VDC (1V resolution) Model V76: 20 to 2750VDC (1V resolution) 1%+5V accuracy under all allowed loading conditions Max. Load <2000V : 10mA (reduce by 10uA per Volt below 1000V), <0.25uF capacitance 2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance 3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitance Leakage Accuracy DUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution) DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution) Otherwise : 1%+20µA (10µA resolution) ARC Limit Disabled or up to 30mA (1mA resolution) Ramp DUT resistive : 0.1 to 99.9sec (0.02sec resolution) DUT capacitive : 1.0 to 99.9sec (0.02sec resolution) Dwell 0.1 to 9999sec (0.02sec resolution) or user terminated Ramp Down 0sec or as defined for ramp Discharge Internal 50KΩ discharge load and 0.03µF capacitive energy Shutdown Excessive HV terminal current : within 1ms User Stop : within 2ms Interlock opened (if enabled) : within 2ms Load Breakdown (sudden uncontrolled increase of load current): within 150µs Leakage Limit (if enabled) : within 100ms ARC Limit (if enabled) : within 1ms User Settings Voltage Level DUT Isolated/Grounded DUT Resistive/Capacitive Min. Leakage Limit (can be disabled) Max. Leakage Limit (can be disabled) ARC Limit (can be disabled) Ramp Period Dwell Period Ramp Down Fast/As Ramp Stop/Continue Sequence on Failure
IR Test Steps
Voltage 20 to 5000VDC (1V resolution) Model V75: 20 to 3000VDC (1V resolution) Model V76: 20 to 2750VDC (1V resolution) 2.5%+5V accuracy under all allowed loading conditions Lowest IR <1000V : 150kΩ 1000-2000V : 400kΩ 2000-3000V : 2MΩ >3000V : 10MΩ Highest IR DUT resistive, isolated : 90MΩ per V DUT capacitive, isolated : 2MΩ per V DUT grounded : 0.1MΩ per V Max Capacitance <1000V : 2uF 1000-2000V : 0.25uF 2000-3000V : 0.1uF >3000V : 0.03uF 5mA maximum charging current IR Accuracy <5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution) Test Time 0.1 to 9999sec (0.1sec resolution) or user terminated Test Delay 0.0 to 9999sec (0.1sec resolution) Discharge Internal 50KΩ discharge load and 0.03µF capacitive energy Shutdown Excessive HV terminal current : within 1ms User Stop : within 2ms Interlock opened (if enabled) : within 2ms Load Breakdown (sudden uncontrolled increase of load current): within 150µs IR Limit (if enabled) : within 100ms ARC Limit (if enabled) : within 1ms User Settings Voltage Level DUT Isolated/Grounded DUT Resistive/Capacitive Min. IR Limit Max. IR Limit (can be disabled) Ramp Period Dwell Period Delay Period Dwell End On Pass/Fail/Time/Steady or Rising Ramp Down Fast/As Ramp Stop/Continue Sequence on Failure
CONT Test Steps
Method 2 terminal measurement (DC) Test Current <10.5mA Test Voltage <4.15V Range 0Ω to 60KΩ Accuracy <0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution) <13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution) Test Time 0.06 to 9999sec (0.02sec resolution) or user terminated CONT Leakage DCW or IR test steps : <0.1µA ACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded) User Settings Min. Limit (can be disabled) Max. Limit (can be disabled) Resistance Offset Test Time Stop/Continue Sequence on Failure
GB Test Steps
Method 4 terminal measurement (AC) Current 1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05% 3%+10mA accuracy Compliance \>4.5Vrms at all currents Open Circuit <10Vpk DUT Ground DUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground. Range Max resistance determined by max compliance and test current Accuracy <2A : 3.5%+3mΩ (1mΩ resolution) 2-6.5A : 3%+2mΩ (1mΩ resolution) >6.5A : 2.5%+1mΩ (0.1mΩ resolution) Test Time ≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated \>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated \>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle) GB Leakage DCW or IR test steps : <1µA ACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded) User Settings Current Level Frequency Min. Limit (can be disabled) Max. Limit Resistance Offset Test Time Stop/Continue Sequence on Failure
PAUSE Test Steps
Pause Delay 0.1 to 9999sec (0.02sec resolution) User Settings Pause Delay
HOLD Test Steps
Timeout 0.1 to 9999sec (0.02sec resolution) or none User Settings Timeout (can be disabled) Message (two lines)
SWITCH Test Steps
Execution Time User Settings Sub Type (Model V75) Relay states for each relay in the specified Sub Type (Model V75) Relay states for each relay in each switch unit (4 max switch units) (All other models)
Dimensional Specifications
137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″) V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shipping V74: 7.9kg (17.5lb) net, 9.1kg (20lb) shipping Dimensions and weights shown are nominal
Environmental Specifications
Storage Environment: -20 to 75C (non-condensing) Operating Environment: 0 to 40C, <85% RH (non-condensing), Pollution Degree 2 Operating Altitude: 0 to 10000ft ASL, reduced maximum voltage capability above 5000ft
Power Source Specifications
Internally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximum
Ordering
Below prices in US$ are for destinations in North America with terms of prepay, net 30 days (OAC) and accepted credit cards. For shipment beyond North America or terms beyond 30 days, please contact the factory for a quotation. If you require rush/expedited shipment please contact Vitrek at (858) 689-2755 or email info@vitrek.com
V7x Series Hipot Testers
ThumbnailNameShort descriptionPriceBuy
V70 quantity
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V71 quantity
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V73 quantity
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V74 quantity
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V76 quantity
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V77 quantity
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V79 quantity
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V7x Accessories
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QTE-7 quantity
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ISO-CALN-V7X1 quantity
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SE-5037-7 quantity
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SE-3624-7 quantity
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SE-2420-7 quantity
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SE-MAT quantity
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QT Pro-7 quantity
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GBP1 quantity
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AVPD-74 quantity
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APVD-79 quantity
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RS-2 quantity
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USB-1 quantity
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TL-30 quantity
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TL-109 quantity
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TL-IEC3 quantity
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TL-UP3 quantity
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K-1 quantity
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TL-IEC2 quantity
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TL-IEC1 quantity
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RPOO-7 quantity
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DIO-X2 quantity
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RM-7 quantity
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V7X-230V quantity
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TL-TP1 quantity
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RSF-7 quantity
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RSS-7 quantity
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HVW-7 quantity
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K-2R quantity
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TL-209 quantity
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TL-115-2 quantity
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TL-115-1 quantity
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TL-UP2 quantity
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TL-UP1 quantity
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APVD-7X quantity
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HC-7X quantity
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USB-2 quantity
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Rentals
The V7X Hipot Tester is available for rent. Please contact the factory for a rental quotation on the items and period of time you desire. Vitrek offers a generous rental allowance for rentals that are converted to a purchase and rentals of 12 months come with a 10% buyout.
V7X Series Downloads
*At the end of your FREE 45 day trial of QT Enterprise software, you must purchase a Software License Key for the appropriate products the software is being used with. See ordering information or contact Vitrek for details at info@vitrek.com (858) 689-2755.